- R.S. Ferguson, K.
     Fobelets, M. M. Ahmad, D.J. Norris, A.G. Cullis, J. Zhang and L. F. Cohen,
     “Determining the composition of SiGe heterostructures using an optical
     microscope” Semiconductor Science and Technology 18(4), pp390-392 (2003)
- K. Fobelets, T.L. Tan,
     K. Thielemans, M.M. Ahmad, R.S. Ferguson, and J. Zhang, “Colour coding Ge
     concentrations in Si1-xGex by bevelling and
     oxidation: CABOOM”, accepted for Semiconductor Science and Technology
     (2004)