1. R.S. Ferguson, K. Fobelets, L.F. Cohen, and M. Pawlik, “A new bevelling technique for low surface roughness base on CMP”, IEE Electron. Lett. 38 (17), 998 (2002)
2. R.S. Ferguson, K. Fobelets, and L. Cohen, “Kelvin probe force microscopy of bevelled semiconductors”, J Vac Sci Technol B 20 (5), pp 2133-2136 (Sept/Oct 2002)
3. R.S. Ferguson, K. Fobelets, and L. Cohen, “Kelvin probe force microscopy of bevelled semiconductors”, Virtual Journal of Nanoscale Science & Technology, December 23 (2002) [link].